Measurements of Relative Permittivity and Dielectric Loss Tangent of Fodel Dielectric with a Split-Post Resonator
نویسندگان
چکیده
The increasing use of computer-based software packages for designing RF/microwave circuits requires very accurate data about dielectric properties of materials used in the design. This paper presents results of precise measurements of relative permittivity and loss tangent of alumina substrates and Fodel dielectric 6050 used in thick-film photoimageable technology for fabricating microwave double-layered circuits. Split-post resonator method has been used in these measurements.
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